Jesd22 a114 b pdf documents

Tlv320adc3101 lowpower stereo adc with embedded minidsp for. Unbiased jesd22a102 45 high temperature storage life hts ta. Pca9545a45b45c 4channel i2cbus switch with interrupt. Jesd47 jesd47 jedec jesd22 b116 free download jesd22 a102c jesd22 a108b jesd22 b116a jesd22 a114 f jesd78b jesd22 a102c text. Acceptable alternative test conditions and temperature tolerances are a through h, i, l, or m as defined in table 1 of jesd22 a104, temperature cycling. Applications serialtoparallel data conversion remote control holding register 74lvc595a 8bit serialinserialout or parallelout shift register. Package preconditioning is performed prior to hast, tc, autoclave, and hts tests.

Jesd22 establishes the physical, electrical, mechanical, and environmental conditions. Electrical tests test name reference standard test conditions units tested units failed esd jesd22 a114 2kv human body model 3pin combination 0 jesd22 a115 200v machine model 3pin combination 0 jesd22 a101 1kv cdm 3 0 latch up avago condition latch up. Jesd22 a1 preconditioning of nonhermetic surface mount devices prior to reliability testing 3. Product qualification report 1edn7512g infineon technologies. Hbm jesd22a114a exceeds 2000 v mm jesd22a115a exceeds 200 v. Jesd22 method ja104 reference standard great temperature change is along with great heat change, the thermal deformation is caused by heat change, thus can cause severe stress change. For hbm and mm 3 new components may be used at each voltage level or pin com. This drawing documents the general requirements of a current sharing 10a dcdc power supply. Product qualification interim report mouser electronics. The purpose of this specification is to establish a reliable and repeatable procedure for determining the hbm esd sensitivity for discrete components. To purchase hard copies of jedec standards or for subscription services, please contact one of the following authorized resellers. The devices consist of eight quasibidirectional ports, 100 khz i2cbus interface, three.

Continue to test the nonsupply to nonsupply pin defined in js0012011 table 2b. The devices consist of eight quasibidirectional ports, 100 khz i2cbus interface, three hardware address inputs and interrupt output operating between 2. B minimum of 1 lot per year for mature products in production for more than 5 years. Jesd22c101 jeita ed4702 jedec jesd22a114 jeita ed4701 302 this product is electrostatic sensitive product, which may be damaged due to electrostatic discharge. A114 datasheet, a114 pdf, a114 data sheet, a114 manual, a114 pdf, a114, datenblatt, electronics a114, alldatasheet, free, datasheet, datasheets, data sheet, datas. To purchase hard copies of jedec standards or for subscription services, please contact one of the. The most recent rerelease was updated in june 2000, and its wip is to work together with esda on the hpc test methods effects of testing the hpc device on smaller pin count testers 1. All throughhole components shall be solderability tested using the dip and look method. I page 1 of 3 cypress semiconductor corporation, 198 champion court, san jose, ca 954. Electrostatic discharge protection, human body model jesd22 a114 b level 2 2kv vrcdm electrostatic discharge protection, charged device model, all pins 1 kv vmm electrostatic discharge protection, machine model, all pins jesd22 a115a level a 200 v latch. Condition duration lotsss failqty result preconditioning jstd020 jesd22 a1 pc msl and 3 x reflow 3 x 385 0 1155 pass temperature humidity biased jesd22 a101. Jesd22a1b page 4 test method a1b revision of test method a1a 3. Note 5 reversal of terminal a and b to achieve dual polarity is not permitted. Acceptable alternative test conditions and temperature tolerances are a through h, i, l, or m as defined in table 1 of jesd22a104, temperature cycling.

Level defined by eia jedec standard jesd22a1, jesd22a114 b a. Aec documents are designed to serve the automotive electronics industry through eliminating. Esd protection exceeds 2000 v hbm per jesd22 a114 and v cdm per jesd22 c101 latchup protection exceeds 100 ma per jesd78 three packages offered. Jedec jesd22a114f electrostatic discharge esd sensitivity testing human body model hbm standard by.

Intel performs comprehensive testing and manufacturing controls on all its fpga products. Jesd22 b103 20g, 202khz 4 mincycle, 4 cyclesaxis, 3 axis 22 0 table 3. Temperaturehumidity soak based on the msl of the part. All manual processing or handling of dmds shall be performed at staticfree.

Care must be exercised in the choice of board and socket materials, to minimize release of contamination and to minimize degradation due to corrosion and other mechanisms. Jesd22a1 b page 2 test method a1 b revision of test method a1a 2. Human body model hbm, per jedec specification jesd22 a114 b, 6000 class ii1 vesd electrostatic discharge v chargeddevice model cdm, per jedec specification jesd22 2000 c1012 1 jedec document jep155 states that 500v hbm allows safe manufacturing with a standard esd control process. This document summarizes the reliability performance of avago technologies adbsa320 low power optical fin ger navigation sensor discussing its product reliability through qualification testing, the failure definition and some general concepts of reliability used for the mttf calculation.

Complete document electrostatic discharge esd sensitivity testing human body model hbm. Each device is 100% rf tested to ensure performance compliance. Jesd22 a114 hbm class 1b pass esd cdm jesd22 c101 cdm class c3 pass environmental stress test results. Any document involving a complex technology brings together experience and skills from many sources. Ordering options type number topside marking package name description version. When special mounting is required, it shall be specified. The latest industry news delivered right to your inbox free. Electrostatic discharge voltage v esd v 2000 jesd22a114 b maximum admissible vibration. Only the english version of this document is the final and determinative format released by diodes incorporated.

Jesd22a101 40 x 1 lot 120 hours, ate electrical test 0 fail 40 ecd 423 esd hbm jesd22a114 3 per level postzap 1 positive discharge and 1 negative discharge per pin for each pin combination, ate electrical test v ecd 430 esd mm jesd22a115 3 per level postzap 1 positive discharge and 1 negative discharge per pin for. Tinbased outer surface finish for external component terminations and other exposed metal. Jesd22a114f, and the esda hbm standard, ansiesd stm5. Ipc9592 requirements for power conversion devices for the computer and telecommunications industries. Jesd22 is a series of uniform methods and procedures for evaluating the reliability of packaged solid state devices. Jesd22a108 temperature, bias, and operating life 3. The masw007921, is a high power gaas spdt switch housed in a 2mm 8lead pdfn package. Ipc9592 requirements for power conversion devices for. The automotive electronics council would especially like to recognize the following significant contributors to the development and initial release of this document. Jesd22 a108 temperature, bias, and operating life 3. Hbm jesd22 a114 exceeds 2000 v mm jesd22 a115 exceeds 200 v cdm jesd22 c101 exceeds v. Many esd standards such as the human body model hbm, machine model mm, charged device model cdm, and iec 642 have been developed to. Jesd22 a114 hbm class 2 2000v to jesd22 c101 cdm class c3 v pass environmental stress test results. Jesd22 a110 highlyaccelerated temperature and humidity stress test 3.

Jesd22a110b page 2 test method a110b revision of a110a 2 apparatus contd 2. Tps22946 ultralow power, low input voltage, currentlimited. Page 4 of 6 the information contained herein is the exclusive property of macronix and shall not be distributed, reproduced, or disclosed in whole or in part without prior written permission of macronix. Cbt3125product data sheet all information provided in this document is subject to legal disclaimers. Subscribe to the jedec standards and documents rss feed to be notified when new documents are uploaded.

Jesd22a114 electrostatic discharge esd sensitivity testing human body 3. Jesd22a114b electrostatic discharge esd sensitivity testing human body. To determine the ability of the part to withstand the customers board mounting process. Electrostatic discharge sensitivity measurement stmicroelectronics. The intent of this document is for users to incorporate these minimal requirements into their esd control program to provide a consistent esd protection level for their products. Solid state technology jedec standardsand engineering.

Esd sensitivity hbm, per jesd22a114 esd 2500 v soldering temperature pbfree profile2 t peak 260. Technical standards e documents online cheapest pdf files downloads. Jesd22a1a level 1 was performed on all samples prior to reliability tests. Jesd22a110 highlyaccelerated temperature and humidity stress test 3.

Jesd22a108 and jesd74 1255 oc, vccmax, 48 hrs 2000 nonvolatile memory cycling endurance nvce jesd47 jesd22a117 aecq05 for automotive product. Jesd22a1 preconditioning of nonhermetic surface mount devices prior to reliability testing 3. Jesd22 a114 electrostatic discharge esd sensitivity testing human body 3. Rf power ldmos transistor nchannel enhancementmode lateral mosfet this 1. Product qualification report infineon technologies. If stress exceed the limit stress, crack and rupture will be observed. Processes performed during the manufacture of a component to reduce the propensity for tin whisker growth by minimizing the surface finish internal compressive stress. Tda18250bhn cable silicon tuner nxp semiconductors.

Product data sheet 3m active optical cable aoc assemblies. The qualification test results of those products as outlined in this document are based on jedec for target. Hbm eiajesd22a114c exceeds 2000 v mm eiajesd22a115a 200 v 3 ordering information table 1. It contains a suite of recommended tin whisker growth tests. If these common tests are adopted, then the industry can collect common and. Refer to jedec specification jesd22 a114 and jesd22 a115. Jesd22a110 b page 3 test method a110 b revision of a110a 3 test conditions contd 3. Meets fcc class b and ce emissions and immunity requirements en642 15kv air discharge during operation, and 8kv direct contact discharges to the case, human body model per jedec jesd22a114 b, human body model jedec jesd22a114 b 8. Attachment 1 aec q101001 reva human body model hbm. User guide of ansiesdajedec js001 human body model. The constant, b, related to the failure mechanism is derived from either internal studies or industry accepted standards, or a b of 1. Proper handling in the manufacturing process and storage conditions are required to prevent voltage exceeding the product maximum rating to be applied to the products.

Jedec jesd22a114 b electrostatic discharge esd sensitivity testing human body model hbm revision of jesd22a114a jedec jesd22a115a electrostatic discharge esd sensitivity testing machine model mm revision of eiajesd22a115 jedec eiajesd78 ic latchup test standard milstd883e miltary test method standard for microcircuits. Reversal of terminals a and b to achieve dual polarity is not permitted. Jedec standard 22b106c page 2 test method b106c revision of test method b106 b 3 materials 3. Please read the important notice and warnings at the end of this document. This document is written in english but may be translated into multiple languages for reference.